Keithley 2401. SourceMeter (SMU) Instrument with GPIB Interface, 1A

• Power: 20 W

• Channels: 1

• Max Current Source/Measure Range: 1A

• Max Voltage Source/Measure Range: 20V

• Measurement Resolution (Current / Voltage): 1pA / 100nV

The Keithley 2401 is a 20V, 1A, 20W SourceMeter® unit (SMU) instrument. It is designed specifically for test applications that demand tightly coupled sourcing and measurement. This SMU provides precision voltage and current sourcing as well as measurement capabilities. It includes both a highly stable DC power source and true instrument grade 6.5 digit multimeter. The power source characteristics include low noise, precision and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single channel, DC parametric tester. In operation, it can act as voltage source, current source, voltage meter, current meter and ohmmeter. Manufacturers of components and modules for communications, semiconductor, computer, automotive and medical industries will find SMU units invaluable for wide range of characterization and production test applications.

Advantages of a Tightly Integrated Instrument

By linking source and measurement circuitry in a single unit, these instruments offer a variety of advantages over systems configured with separate source and measurement instruments. For example, they minimize the time required for test station development, setup, and maintenance, while lowering the overall cost of system ownership. They simplify the test process itself by eliminating many of the complex synchronization and connection issues associated with using multiple instruments. And, their compact half-rack size conserves precious “real estate” in the test rack or bench.

Legacy Products and Suggested Alternatives

The 2401 SourceMeter SMU Instruments in this datasheet are classified as “Legacy Products”. They have been succeeded by Keithley’s newer 2401 Series Graphical SourceMeter SMUs with improved and greater performance. For new applications and designs, Keithley recommends you consider using the newer graphical models. The table provides a list of suggested graphical models for new applications and designs.

Typical Applications Devices

• Discrete semiconductor devices

• Passive devices

• Transient suppression devices

• ICs, RFICs, MMICs

• Laser diodes, laser diode modules, LEDs, photodetectors

• Circuit protection devices: TVS, MOV, Fuses, etc.

• Airbags

• Connectors, switches, relays

• High brightness LEDs (DC and pulse)

Tests

• Leakage

• Low voltage/resistances

• LIV

• IDDQ

• I-V characterization

• Isolation and trace resistance

• Temperature coefficient

• Forward voltage, reverse breakdown, leakage current

• DC parametric test

• DC power source

• HIPOT

• Photovoltaic cell efficiency (source and sink)

• Dielectric withstanding

I-V Characteristics
All SourceMeter SMU instruments provide four-quadrant operation. In the first and third quadrants they operate as a source, delivering power to a load. In the second and fourth quadrants they operate as a sink, dissipating power internally. Voltage, current, and resistance can be measured during source or sink operation.

Automation for Speed
A SourceMeter SMU instrument streamlines production testing. It sources voltage or current while making measurements without needing to change connections. It is designed for reliable operation in non-stop production environments. To provide the throughput demanded by production applications, the SourceMeter SMU instrument offers many built-in features that allow it to run complex test sequences without computer control or GPIB communications slowing things down.

Standard and Custom Sweeps
Sweep solutions greatly accelerate testing with automation hooks. Three basic sweep waveforms are provided that can be programmed for single-event or continuous operation. They are ideal for I/V, I/R, V/I, and V/R characterization.

Built-In Test Sequencer (Source Memory List)

The Source Memory list provides faster and easier testing by allowing you to setup and execute up to 100 different tests that run without PC intervention.

• Stores up to 100 instrument configurations, each containing source settings, measurement settings, pass/fail criteria, etc.

• Pass/fail limit test as fast as 500 μs per point

• Onboard comparator eliminates the delay caused when sending data to the computer for analysis

• Built-in, user definable math functions to calculate derived parameters

Integrate with switching systems for fast, multipoint testing

The instruments in the SourceMeter family offer wide versatility, so they make great solutions for a variety of applications in many industries. For seamless integration in fast multipoint testing applications, combine a SourceMeter instrument with a Keithley switch system.

• Test semiconductor devices

• Test circuit Protection devices

• Test optoelectronic components

• Use for accelerated stress testing

Preparing engineering students to turn ideas into reality

Keithley SourceMeter SMUs are excellent tools to teach students the concepts of Ohms Law and I-V characterization for lab exercises to better understand how electronic devices behave and are used. SMUs give students the experience they need so they are prepared to meet the industry standards.

• Combines the power of 5 instruments in one

• Simplifies the teaching lab bench

• Useful in graduate research

Instrument Control Start-up Software

KickStart Instrument Control/Start-up Software enables users to start making measurements in minutes without programming. In most cases, users merely need to make some quick measurements, graph the data, and store the data to disk for later analysis in software environments such as Excel. KickStart offers:

• Configure and control up to four SMU instruments for DC or Pulsed I-V test in either the same app, same project, or a combination of the two.

• Create tests by mixing any of these SMU instruments: 2410 Graphical Series, 2410 Standard Series (DC only), 2600B Series, 2651A, 2657A, and 6430 SourceMeter® SMU (DC only) instruments.

• Differentiate SMU instrument channels and their measurement data using labels that are relevant to your device or module.

• Native X-Y graphing, panning, and zooming; screenshot capturing of graphs.

• Spreadsheet/tabular viewing of data; export data for further analysis.

• Annotating of tests; save test setups.

• GPIB, USB 2.0, Ethernet compliance.

In The Box

• Model 8605 Test Leads

• LabVIEW Software Driver (downloadable)

• LabTracer Software (downloadable)